X射线衍射测试样品位置对谱线峰位和强度的影响

Effects of Sample Position on Peak Position and Intensity of Spectrum During X-ray Diffraction Test

中文关键词:  X射线衍射  峰位  峰强度

英文关键词:XRD  peak position  peak intensity

中文摘要:

      鉴于X’Pert Pro MRD多晶X射线衍射仪的样品台5维可移动，研究了样品的位置对物相测试中谱线峰强度和峰位的影响.结果表明，样品表面低于或者高于光路中心，都会造成谱图峰位的偏移，对峰强度影响不明显.当样品表面低于光路中心位置时，峰位呈减小趋势.当样品表面高于光路中心位置时，峰位呈增加趋势.当水平位置放置了不同厚度的样品进行批处理测试时，谱线的峰强度会受到最厚的样品的影响，峰位的变化不明显.

英文摘要:

      The X’Pert Pro MRD cradle can provide five motorized movements. The effects of sample position on the peak position and intensity of spectrum during the X-ray diffraction (XRD) test were studied. Results showed that the peak position of the spectrum would shift when the surface of the sample is lower or higher than the center of the optical path, while the peak intensity would not be significantly affected. The peak position would show a decreasing or increasing trend depending on whether the surface of the sample is lower or higher than the central position of the optical path. The peak intensity of spectrum would be affected by the thickest sample when samples with different thicknesses are placed horizontally for batch testing, while the change of peak position is not obvious.