铸铁中硅、磷、钼等九种元素的ICP-AES测定
Determination of Silicon, Phosphorous etc. in Cast Iron by ICP-AES
投稿时间:1997-11-15  修订日期:1998-01-15
DOI:
中文关键词:  铸铁    电感耦合等离子体发射光谱
英文关键词:cast iron  silicon  ICP-AES
基金项目:
作者单位
王春梅 电子部46所 天津 300192 
张淑珍 电子部46所 天津 300192 
吴琼 电子部46所 天津 300192 
摘要点击次数: 804
全文下载次数: 1
中文摘要:
      采用ICP-AES对铸铁中硅、磷、钛、钼、镍、锰、铬、铝和铜杂质的测定进行了研究.考察了铁对待测元素的干扰情况,发现铁对铜有光谱尾翼干扰,干扰系统为1.0×10-5.采用不同的酸溶解样品时,硅的测定结果有显着的差别.
英文摘要:
      A method of detection of nine elements including Si, P, etc. in cast iron was developed. Interference effect on analysed elements were studied and interference coefficient of iron on copper was 1.0×10-5.The recovery test showed the method to have good precision. Different acids had apparent difference on determination of Silicon.
HTML  查看全文  查看/发表评论  下载PDF阅读器