用理学3064X荧光仪分析碳

Determination of Carbon with Rigaku 3064 XRF Spectrometer

中文关键词:  X射线荧光仪  分析  碳  晶体

英文关键词:X-rayfluorescence spectrometer  analysis  carbon  crystal

中文摘要:

      在理学3064X荧光仪上采用十八烷基马来酸(OHM)晶体作为色散单元,通过改造电路,调整晶体倾角,获得对碳分析的良好线性,在流气正比计数器(FPC)窗膜分别为5μm和0.6μm条件下,碳元素的峰背比分别达到38.91和54.04.作者分析了白口铸铁和碳化硅中的碳,结果表明在理学3064X荧光仪上定量分析碳是可行了,具有快速、简便、准确、多元素同时分析的特点,可用于日常分析.

英文摘要:

      A method for the XRF determination of carbon with OHM crystal as dispersion unit is described.Through adjusting circuit and crystal angle,the signal to noise ratio could reach 38.19 and 54.04 when the thickness of the FPC window film are 5μm and 0 6μm respectively.The results obtained show that the determination of carbon in white cast iron,graphite and SIC by XRF is fast,simple and accurate,and can meet the requirement of routine analysis.