测定ZSM—5分子筛SiO2/Al2O3比的X射线衍射分析新方法

SiO2/Al2O3 Ratio of ZSM-5 Zeolite Determined by X-Ray Diffraction Analysis

中文关键词:  XRD  ZSM－5分子筛  SiO₂/Al₂O₃比

英文关键词:XRD  ZSM-5 Zeolite  SiO₂/Al₂O₃ ratio

中文摘要:

      用X射线衍射最小二乘法测定ZSM-5分子筛的晶胞参数,由SiO₂/Al₂O₃比与品胞体积之间的经验公式,可得到ZSM-5分子筛的SiO₂/Al₂O₃比.实验结果分析表明,该方法测定的ZSM-5分子筛SiO₂/Al₂O₃比较通常采用的化学分析法省时、简便、重复性好.

英文摘要:

      ZSM-5 Zeolite was examined with a Japan diffractomcter (D max-RB X-Ray Diffractometer). The data obtained were boied by means of the least square method to give the Cell volume of the zeolite. According to an empirical formula correlating the Cell volume with the SiO₂/Al₂O₃ ratio, the latter can be easily obtained. This method is simpler and convenient and itS repeatabillty is better than common chemical analysis.