X-射线单晶衍射仪易风化晶体低温显微上样系统的研制

Development of Microscopic Selecting and Sampling System in Low-Temperature Environments for Single Crystal X-Ray Diffractometer to Test Weathering-Suspected Crystals

中文关键词:  X-射线单晶衍射仪  单晶  易风化晶体  低温

英文关键词:X-ray single crystal diffractometer  single crystal  weathering-suspected crystals  low temperatures

中文摘要:

      易风化晶体离开母液就会风化并失去结晶溶剂，导致结构塌陷，由单晶变成粉末，从而无法完成测试.X-射线单晶衍射仪易风化晶体低温显微上样系统利用晶体在低温下比较稳定的原理，通过维持选样与上样过程中的低温环境，使易风化晶体能够得以测试，从根本上解决了风化晶体的测试问题.系统的研制为易风化晶体化合物结构的测试提供有力的技术保障，是单晶衍射仪功能开发的重要技术创新.

英文摘要:

      Weathering-suspected crystals will be weathered and lose crystalline solvent after depend from the mother liquor, and result in the structural collapse and turn into powder, thus to test weathering-suspected crystals is very difficult. Making use of the principle that weathering-suspected crystals are usually relatively stable at low temperatures, we developed a special system to help selecting and sampling in low- temperature environment, so that the diffraction data for weathering-suspected crystals cab be obtained. The development of this system provides a strong technical guarantee for the testing of the structure weathering-suspected crystals in related research. It is an important technological innovation in the functional development of single crystal diffractometers.