XPS在复合材料磷酸钛-磷钼酸铵化学结构研究中的应用
Application of XPS to the structure study of Complex material Titanium Phosphate-Ammonium Molybdophosphate
投稿时间:1999-12-21  修订日期:2000-03-17
DOI:
中文关键词:  X-射线光电子能谱  TiP-AMP  化学位移  复合机理
英文关键词:XPS  TiP-AMP  binding energy shift  complex mechanism
基金项目:
作者单位
余心田 厦门市杏林环境监测站, 福建厦门361022 
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中文摘要:
      X射线光电子能谱(XPS)是一种有效的表面化学测试手段,对化合物中各种元素的化学状态具有非常敏感的探测能力,从而对复杂材料的成键机理提供有效的信息.通过研究TiP-AMP中各元素在复合前后的X结合能谱的化学位移,对交换材料的复合机理进行了探讨.
英文摘要:
      As a sensitive superficial inspection method, X-ray photoelectronic spectroscopy(XPS) is very useful for chemical structure detection, It can offer very useful information for the bonding mechanism of complex material. The XPS of each elements in the complex inorganic ion exchanger titanium phosphate ammonium molybdophosphate(TiP-AMP) was studied. The complex mechanism of the substance was discovered through studying binding energy shift of each elements.
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